J Synchrotron Radiat January 2021 PMID 33399552

Single-pulse phase-contrast imaging at free-electron lasers in the hard X-ray regime.

Johannes Hagemann, Malte Vassholz, Hannes Hoeppe, Markus Osterhoff, Juan M Rosselló, Robert Mettin, Frank Seiboth, Andreas Schropp, Johannes Möller, Jörg Hallmann, Chan Kim, Markus Scholz, Ulrike Boesenberg, Robert Schaffer, Alexey Zozulya

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Peak: 2 in Jun 2021

across 2 sources since Dec 2020

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Discussions reflect a positive reception toward the article, often highlighting its technical innovations such as single-pulse imaging and wavefront sampling. Words like 'promising' and 'breakthrough' demonstrate excitement and recognition of significance, while technical references indicate deep engagement with the scientific content.

AgreementModerate agreement

Most discussions acknowledge the significance of the research, indicating a general agreement with its findings and potential.

InterestHigh interest

Participants show high curiosity about the technical advances and applications, reflecting strong interest.

EngagementModerate engagement

Comments include specific references to imaging techniques and implications, suggesting active engagement.

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There is a sense that this work could influence future research and imaging methods, implying moderate perceived impact.

Abstract in brief

The text discusses how X-ray free-electron lasers (XFELs) enable high-resolution, time-resolved imaging of nanoscale samples through nearfield holography (NFH), capturing rapid dynamics with single pulses.
It highlights a method to handle the randomness of SASE (self-amplified spontaneous emission) XFEL pulses by sampling their wavefront configurations prior to imaging and using principal component analysis to improve image reconstruction.
The study demonstrates this approach by imaging the complex behavior of a microfluidic waterjet, including droplet formation and cavitation effects induced by an infrared laser, showcasing the technique's capability for detailed dynamic studies.]

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All mentions

Single-Pulse Phase-Contrast Imaging at XFELs for Nanoscale Dynamics

X-ray free-electron lasers enable high-resolution, time-resolved imaging of nanoscale samples through nearfield holography. This study demonstrates how sampling SASE pulse wavefronts and using principal component…

International Union of Crystallography · Jun 19, 2021 47 views

Single-Pulse Phase-Contrast Imaging with XFELs for Nanoscale Dynamics

X-ray free-electron lasers enable high-resolution, time-resolved nanoscale imaging through nearfield holography, capturing rapid specimen dynamics with single pulses. This study presents a method to address pulse…

International Union of Crystallography · Jun 19, 2021 29 views

M.O. @sci_photos@troet.cafe – tschöö mit trööt

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RT @JSynchrotronRad: Johannes Hagemann et al.: Single-pulse phase-contrast imaging at free-electron lasers in the hard X-ray regime #Diffr…

Jul 25, 2022 · 1 share · 164 followers View post →

J Synchrotron Rad

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Johannes Hagemann et al.: Single-pulse phase-contrast imaging at free-electron lasers in the hard X-ray regime #DiffractThenDestroy #PhaseProblem ... #IUCr https://t.co/JAtOYn6XGE

Dec 22, 2020 · 1 like · 1 share · 1,449 followers View post →