Publications by authors named "Alexander Gottwald"

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GLObal Solar Wind Structure (GLOWS).
Maciej Bzowski, Roman Wawrzaszek, Marek Strumik, Jȩdrzej Baran, Tomasz Barciński, Alexander Gottwald

Space Sci Rev· November 2025

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Large Distortion of Fused Aromatics on Dielectric Interlayers Quantified by Photoemission Orbital Tomography.
Philipp Hurdax, Christian S Kern, Thomas Georg Boné, Anja Haags, Michael Hollerer, Alexander Gottwald

ACS Nano· October 2022

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Momentum space imaging of σ orbitals for chemical analysis.
Anja Haags, Xiaosheng Yang, Larissa Egger, Dominik Brandstetter, Hans Kirschner, Alexander Gottwald

Sci Adv· July 2022

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Hexacene on Cu(110) and Ag(110): Influence of the Substrate on Molecular Orientation and Interfacial Charge Transfer.
Marie S Sättele, Andreas Windischbacher, Katharina Greulich, Larissa Egger, Anja Haags, Alexander Gottwald

J Phys Chem C Nanomater Interfaces· March 2022

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Charge-Promoted Self-Metalation of Porphyrins on an Oxide Surface.
Larissa Egger, Michael Hollerer, Christian S Kern, Hannes Herrmann, Philipp Hurdax, Alexander Gottwald

Angew Chem Int Ed Engl· March 2021

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Ladungsunterstützte Selbstmetallierung von Porphyrinen auf Oxidoberflächen.
Larissa Egger, Michael Hollerer, Christian S Kern, Hannes Herrmann, Philipp Hurdax, Alexander Gottwald

Angew Chem Weinheim Bergstr Ger· March 2021

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Going beyond Pentacene: Photoemission Tomography of a Heptacene Monolayer on Ag(110).
Marie S Sättele, Andreas Windischbacher, Larissa Egger, Anja Haags, Philipp Hurdax, Alexander Gottwald

J Phys Chem C Nanomater Interfaces· February 2021

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Kekulene: On-Surface Synthesis, Orbital Structure, and Aromatic Stabilization.
Anja Haags, Alexander Reichmann, Qitang Fan, Larissa Egger, Hans Kirschner, Alexander Gottwald

ACS Nano· November 2020

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Controlling the electronic and physical coupling on dielectric thin films.
Philipp Hurdax, Michael Hollerer, Larissa Egger, Georg Koller, Xiaosheng Yang, Alexander Gottwald

Beilstein J Nanotechnol· October 2020

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An X-ray gas monitor for free-electron lasers.
Andrey A Sorokin, Yilmaz Bican, Susanne Bonfigt, Maciej Brachmanski, Markus Braune, Alexander Gottwald

J Synchrotron Radiat· July 2019

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Identifying surface reaction intermediates with photoemission tomography.
Xiaosheng Yang, Larissa Egger, Philipp Hurdax, Hendrik Kaser, Daniel Lüftner, Alexander Gottwald

Nat Commun· July 2019

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The U125 insertion device beamline at the Metrology Light Source.
Alexander Gottwald, Hendrik Kaser, Michael Kolbe

J Synchrotron Radiat· March 2019

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Optical properties of a Cr/4H-SiC photodetector in the spectral range from ultraviolet to extreme ultraviolet.
Alexander Gottwald, Udo Kroth, Evgenia Kalinina, Vladimir Zabrodskii

Appl Opt· October 2018

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Uncertainty analysis for the determination of BC optical constants by angle-dependent reflectance measurement for 40  nm to 80  nm wavelength.
Alexander Gottwald, Karl Wiese, Udo Kroth, Mathias Richter

Appl Opt· July 2017

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Irradiation-induced degradation of PTB7 investigated by valence band and S 2p photoelectron spectroscopy.
Erik Darlatt, Burhan Muhsin, Roland Roesch, Cosmin Lupulescu, Friedrich Roth, Alexander Gottwald

Nanotechnology· August 2016

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Polarization-dependent vacuum-ultraviolet reflectometry using elliptically polarized synchrotron radiation.
Alexander Gottwald, Françoise Bridou, Mireille Cuniot-Ponsard, Jean-Michel Desvignes, Simone Kroth

Appl Opt· November 2007

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Absolute measurement of F2-laser power at 157 nm.
Stefan Kück, Friedhelm Brandt, Hans-Albert Kremling, Alexander Gottwald, Arne Hoehl

Appl Opt· May 2006

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Metrology of pulsed radiation for 157-nm lithography.
Mathias Richter, Udo Kroth, Alexander Gottwald, Christopher Gerth, Kai Tiedtke

Appl Opt· December 2002

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