Publications by authors named "Alexandra Delvallee"

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Toward a Correlative Metrology Approach on the Same 2D Flake: Graphene Oxide Case Study-Sample Preparation and Stability Issues.
Lydia Chibane, Alexandra Delvallée, Nolwenn Fleurence, Sarah Douri, José Morán-Meza

Nanomaterials (Basel)· December 2025

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Characterisation of titanium dioxide (nano)particles in foodstuffs and E171 additives by inductively coupled plasma-tandem mass spectrometry using a highly efficient sample introduction system.
Isabel Bastardo-Fernández, Rachida Chekri, Johanna Noireaux, Lucas Givelet, Nora Lambeng

Food Addit Contam Part A Chem Anal Control Expo Risk Assess· August 2024

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Strategy for Ensuring the Metrological Traceability of Nanoparticle Size Measurements by SEM.
Nicolas Feltin, Alexandra Delvallée, Loïc Crouzier

Nanomaterials (Basel)· May 2024

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Thickness measurements of graphene oxide flakes using atomic force microscopy: results of an international interlaboratory comparison.
Tianjia Bu, Huifang Gao, Yaxuan Yao, Jianfeng Wang, Andrew J Pollard

Nanotechnology· March 2023

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Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles.
Nicolas Feltin, Loïc Crouzier, Alexandra Delvallée, Francesco Pellegrino, Valter Maurino

Nanomaterials (Basel)· March 2023

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Correlative Analysis of the Dimensional Properties of Bipyramidal Titania Nanoparticles by Complementing Electron Microscopy with Other Methods.
Loïc Crouzier, Nicolas Feltin, Alexandra Delvallée, Francesco Pellegrino, Valter Maurino

Nanomaterials (Basel)· December 2021

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Traceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy.
Damien Richert, José Morán-Meza, Khaled Kaja, Alexandra Delvallée, Djamel Allal

Nanomaterials (Basel)· November 2021

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Influence of electron landing energy on the measurement of the dimensional properties of nanoparticle populations imaged by SEM.
Loïc Crouzier, Alexandra Delvallée, Laurent Devoille, Sébastien Artous, François Saint-Antonin

Ultramicroscopy· July 2021

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Deep Learning Based Instance Segmentation of Titanium Dioxide Particles in the Form of Agglomerates in Scanning Electron Microscopy.
Paul Monchot, Loïc Coquelin, Khaled Guerroudj, Nicolas Feltin, Alexandra Delvallée

Nanomaterials (Basel)· April 2021

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Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy.
François Piquemal, José Morán-Meza, Alexandra Delvallée, Damien Richert, Khaled Kaja

Nanomaterials (Basel)· March 2021

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A new method for measuring nanoparticle diameter from a set of SEM images using a remarkable point.
Loïc Crouzier, Alexandra Delvallée, Sébastien Ducourtieux, Laurent Devoille, Christophe Tromas

Ultramicroscopy· December 2019

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Development of a new hybrid approach combining AFM and SEM for the nanoparticle dimensional metrology.
Loïc Crouzier, Alexandra Delvallée, Sébastien Ducourtieux, Laurent Devoille, Guillaume Noircler

Beilstein J Nanotechnol· July 2019

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Scanning microwave microscopy applied to semiconducting GaAs structures.
Arne Buchter, Johannes Hoffmann, Alexandra Delvallée, Enrico Brinciotti, Dimitri Hapiuk

Rev Sci Instrum· February 2018

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