Publications by authors named "Amram Azulay"

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A statistical approach for interplanar spacing metrology at a relative uncertainty below 10 using scanning transmission electron microscopy.
Amram Azulay, Itai Silber, Yoram Dagan, Amit Kohn

Micron· March 2025

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Enhanced Charge Transport in CaMnO-Layered Perovskites by Point Defect Engineering.
Amram Azulay, Marwan Wahabi, Yuriy Natanzon, Yaron Kauffmann, Yaron Amouyal

ACS Appl Mater Interfaces· November 2020

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