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Publications by authors named "B C Valek"

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Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films.
N Tamura, A A MacDowell, R Spolenak, B C Valek, J C Bravman

J Synchrotron Radiat· March 2003


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Local plasticity of Al thin films as revealed by x-ray microdiffraction.
R Spolenak, W L Brown, N Tamura, A A MacDowell, R S Celestre, B Valek

Phys Rev Lett· March 2003


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