Publications by authors named "Christophe Secouard"

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Investigation of Lithium Insertion Mechanisms of a Thin-Film Si Electrode by Coupling Time-of-Flight Secondary-Ion Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Focused-Ion-Beam/SEM.
Arnaud Bordes, Eric De Vito, Cédric Haon, Christophe Secouard, Alexandre Montani

ACS Appl Mater Interfaces· December 2015

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