Publications by authors named "Daniel Uehli"

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Stiffness calibration of qPlus sensors at low temperature through thermal noise measurements.
Laurent Nony, Sylvain Clair, Daniel Uehli, Aitziber Herrero, Jean-Marc Themlin

Beilstein J Nanotechnol· May 2024

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Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis.
Tom Wirtz, Yves Fleming, Mathieu Gerard, Urs Gysin, Thilo Glatzel, Daniel Uehli

Rev Sci Instrum· June 2012

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