Publications by authors named "David F Wenger"

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Profiled bar transmission gratings: soft-x-ray calibration of new Kirchoff solutions.
Michael C Hettrick, Michael E Cuneo, John L Porter, Larry E Ruggles, Walter W Simpson, David F Wenger

Appl Opt· July 2004

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Evaluation of bent-crystal x-ray backlighting and microscopy techniques for the Sandia Z machine.
Daniel B Sinars, Guy R Bennett, David F Wenger, Michael E Cuneo, John L Porter

Appl Opt· July 2003

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