Publications by authors named "David G Refaldi"

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Origin of the Temperature Dependence of Gate-Induced Drain Leakage-Assisted Erase in Three-Dimensional nand Flash Memories.
David G Refaldi, Gerardo Malavena, Luca Chiavarone, Alessandro S Spinelli, Christian Monzio Compagnoni

Micromachines (Basel)ยท December 2024

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