Publications by authors named "David L Windt"

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B
Bilayer and trilayer X-ray mirror coatings containing W, Pt, or Ir, in combination with C, C/Co, BC, or BC/Ni: X-ray reflectance, film stress, and temporal stability.
David L Windt, Raymond P Conley, Eric M Gullikson, Christian Gollwitzer, Michael Krumrey

Appl Opt· December 2023

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Monochromatic mammography using scanning multilayer X-ray mirrors.
David L Windt

Rev Sci Instrum· August 2018

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Pd/B4C/Y multilayer coatings for extreme ultraviolet applications near 10  nm wavelength.
David L Windt, Eric M Gullikson

Appl Opt· June 2015

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Laboratory-based X-ray reflectometer for multilayer characterization in the 15-150 keV energy band.
David L Windt

Rev Sci Instrum· April 2015

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Extreme ultraviolet multilayer for the FERMI@Elettra free electron laser beam transport system.
Alain Jody Corso, Paola Zuppella, David L Windt, Marco Zangrando, Maria Guglielmina Pelizzo

Opt Express· March 2012

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C
Capped Mo/Si multilayers with improved performance at 30.4 nm for future solar missions.
Alain Jody Corso, Paola Zuppella, Piergiorgio Nicolosi, David L Windt, E Gullikson

Opt Express· July 2011

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Iridium/silicon multilayers for extreme ultraviolet applications in the 20-35 nm wavelength range.
Paola Zuppella, Gianni Monaco, Alain Jody Corso, Piergiorgio Nicolosi, David L Windt

Opt Lett· April 2011

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Extreme-ultraviolet multilayer coatings with high spectral purity for solar imaging.
Michele Suman, Maria Guglielmina Pelizzo, David L Windt, Piergiorgio Nicolosi

Appl Opt· October 2009

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Performance optimization of Si/Gd extreme ultraviolet multilayers.
David L Windt, Jeffrey A Bellotti, Benjawan Kjornrattanawanich, John F Seely

Appl Opt· October 2009

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Performance, structure, and stability of SiC/Al multilayer films for extreme ultraviolet applications.
David L Windt, Jeffrey A Bellotti

Appl Opt· September 2009

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Measurement of dysprosium optical constants in the 2-830 eV spectral range using a transmittance method, and compilation of the revised optical constants of lanthanum, terbium, neodymium, and gadolinium.
Benjawan Kjornrattanawanich, David L Windt, Jeffrey A Bellotti, John F Seely

Appl Opt· June 2009

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Realization and characterization of an XUV multilayer coating for attosecond pulses.
Michele Suman, Gianni Monaco, Maria Guglielmina Pelizzo, David L Windt, Piergiorgio Nicolosi

Opt Express· May 2009

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High performance EUV multilayer structures insensitive to capping layer optical parameters.
Maria Guglielmina Pelizzo, Michele Suman, Gianni Monaco, Piergiorgio Nicolosi, David L Windt

Opt Express· September 2008

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Aperiodic multilayers with enhanced reflectivity for extreme ultraviolet lithography.
Michele Suman, Maria-Guglielmina Pelizzo, Piergiorgio Nicolosi, David L Windt

Appl Opt· June 2008

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Normal-incidence silicon-gadolinium multilayers for imaging at 63 nm wavelength.
Benjawan Kjornrattanawanich, David L Windt, John F Seely

Opt Lett· May 2008

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Atomic force microscopy characterization of Zerodur mirror substrates for the extreme ultraviolet telescopes aboard NASA's Solar Dynamics Observatory.
Regina Soufli, Sherry L Baker, David L Windt, Eric M Gullikson, Jeff C Robinson

Appl Opt· June 2007

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SiC/Tb and Si/Tb multilayer coatings for extreme ultraviolet solar imaging.
Benjawan Kjornrattanawanich, David L Windt, John F Seely, Yurii A Uspenskii

Appl Opt· March 2006

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Terbium-based extreme ultraviolet multilayers.
David L Windt, John F Seely, Benjawan Kjornrattanawanich, Yu A Uspenskii

Opt Lett· December 2005

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Normal-incidence efficiencies of multilayer-coated laminar gratings for the extreme-ultraviolet imaging spectrometer on the solar-B mission.
John F Seely, Charles M Brown, David L Windt, Soizik Donguy, Benjawan Kjornrattanawanich

Appl Opt· March 2004

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Experimental comparison of extreme-ultraviolet multilayers for solar physics.
David L Windt, Soizik Donguy, John Seely, Benjawan Kjornrattanawanich

Appl Opt· March 2004

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W
W/SiC x-ray multilayers optimized for use above 100 keV.
David L Windt, Soizik Donguy, Charles J Hailey, Jason Koglin, Veijo Honkimaki

Appl Opt· May 2003

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Normal-incidence reflectance of optimized W /B(4) C x-ray multilayers in the range 1.4 nm < l > 2.4 nm.
David L Windt, Eric M Gullikson, Christopher C Walton

Opt Lett· December 2002

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