Publications by authors named "David M Barnett"

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Simulating and interpreting Kelvin probe force microscopy images on dielectrics with boundary integral equations.
Yongxing Shen, David M Barnett, Peter M Pinsky

Rev Sci Instrum· February 2008

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A resolution study for electrostatic force microscopy on bimetallic samples using the boundary element method.
Yongxing Shen, Minhwan Lee, Wonyoung Lee, David M Barnett, Peter M Pinsky

Nanotechnology· January 2008

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