Publications by authors named "Edward Hanson"

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Towards Traceable Transient Pressure Metrology.
Edward Hanson, Douglas Olson, Haijun Liu, Zeeshan Ahmed, Kevin O Douglass

Metrologia· April 2018

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Quantum-based vacuum metrology at NIST.
Julia Scherschligt, James A Fedchak, Zeeshan Ahmed, Daniel S Barker, Kevin Douglass, Edward Hanson

J Vac Sci Technol A· January 2018

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