Publications by authors named "Hugo Bender"

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Unravelling stacking order in epitaxial bilayer MX using 4D-STEM with unsupervised learning.
Ankit Nalin Mehta, Nicolas Gauquelin, Magnus Nord, Andrey Orekhov, Hugo Bender

Nanotechnology· October 2020

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Ferroelectricity in Si-Doped Hafnia: Probing Challenges in Absence of Screening Charges.
Umberto Celano, Andres Gomez, Paola Piedimonte, Sabine Neumayer, Liam Collins, Hugo Bender

Nanomaterials (Basel)· August 2020

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Effects of buried grain boundaries in multilayer MoS.
Jonathan Ludwig, Ankit Nalin Mehta, Marco Mascaro, Umberto Celano, Daniele Chiappe, Hugo Bender

Nanotechnology· July 2019

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The flexoelectric effect in Al-doped hafnium oxide.
Umberto Celano, Mihaela Popovici, Karine Florent, Simone Lavizzari, Paola Favia, Hugo Bender

Nanoscale· May 2018

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Effect of Boron Doping on the Wear Behavior of the Growth and Nucleation Surfaces of Micro- and Nanocrystalline Diamond Films.
Josephus G Buijnsters, Menelaos Tsigkourakos, Thomas Hantschel, Francis O V Gomes, Thomas Nuytten, Hugo Bender

ACS Appl Mater Interfaces· October 2016

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Imaging the Three-Dimensional Conductive Channel in Filamentary-Based Oxide Resistive Switching Memory.
Umberto Celano, Ludovic Goux, Robin Degraeve, Andrea Fantini, Olivier Richard, Hugo Bender

Nano Lett· December 2015

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Root-cause failure analysis of photocurrent loss in polythiophene:fullerene-based inverted solar cells.
Eszter Voroshazi, Griet Uytterhoeven, Kjell Cnops, Thierry Conard, Paola Favia, Hugo Bender

ACS Appl Mater Interfaces· January 2015

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Three-dimensional observation of the conductive filament in nanoscaled resistive memory devices.
Umberto Celano, Ludovic Goux, Attilio Belmonte, Karl Opsomer, Alexis Franquet, Hugo Bender

Nano Lett· May 2014

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Influence of carbon alloying on the thermal stability and resistive switching behavior of copper-telluride based CBRAM cells.
Wouter Devulder, Karl Opsomer, Felix Seidel, Attilio Belmonte, Robert Muller, Hugo Bender

ACS Appl Mater Interfaces· August 2013

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T
Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts.
Xiaoxing Ke, Sara Bals, Daire Cott, Thomas Hantschel, Hugo Bender

Microsc Microanal· April 2010

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TEM sample preparation by FIB for carbon nanotube interconnects.
Xiaoxing Ke, Sara Bals, Ainhoa Romo Negreira, Thomas Hantschel, Hugo Bender

Ultramicroscopy· October 2009

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Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy.
Florian Hüe, Martin Hÿtch, Hugo Bender, Florent Houdellier, Alain Claverie

Phys Rev Lett· April 2008

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