Publications by authors named "Iris Mack"

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Decreasing Interface Defect Densities via Silicon Oxide Passivation at Temperatures Below 450 °C.
Zahra Jahanshah Rad, Juha-Pekka Lehtiö, Iris Mack, Kawa Rosta, Kexun Chen

ACS Appl Mater Interfaces· October 2020

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