Publications by authors named "Jack Haley"

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Cryogenic sample preparation: Comparative analysis of Ga and Xe FIB milling for TEM and APT examination of zirconium.
Ömer Koç, Benjamin M Jenkins, Jack Haley, Christina Hofer, Martin S Meier

Ultramicroscopy· November 2025

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Effect of sample thinning on strains and lattice rotations measured from Transmission Kikuchi diffraction in the SEM.
Phani S Karamched, Naganand Saravanan, Jack C Haley, Angus J Wilkinson, Sergio Lozano-Perez

Ultramicroscopy· June 2021

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