Publications by authors named "Jae-Wan Kim"

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Characteristics of Merging Plasma Plumes for Materials Process Using Two Atmospheric Pressure Plasma Jets.
Sang Un Jeon, Jae Wan Kim, Hyun-Young Lee, Gyoo-Cheon Kim, Hae June Lee

Materials (Basel)· October 2024

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Intelligent Resource Allocation Scheme Using Reinforcement Learning for Efficient Data Transmission in VANET.
Jin-Woo Kim, Jae-Wan Kim, Jaeho Lee

Sensors (Basel)· April 2024

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A Novel Endogenous Damage Signal, CSF-2, Activates Multiple Beneficial Functions of Adipose Tissue-Derived Mesenchymal Stem Cells.
Se-Ra Park, Ara Cho, Jae-Wan Kim, Hwa-Yong Lee, In-Sun Hong

Mol Ther· June 2019

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High-resolution angle sensor using multiple peak positions of a double slit interference pattern.
Jong-Ahn Kim, Jae Wan Kim, Jae Yong Lee, Chu-Shik Kang, Jonghan Jin

Rev Sci Instrum· April 2019

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A Cooperative Communication Protocol for QoS Provisioning in IEEE 802.11p/Wave Vehicular Networks.
Jin-Woo Kim, Jae-Wan Kim, Dong-Keun Jeon

Sensors (Basel)· October 2018

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Note: An absolute X-Y-Θ position sensor using a two-dimensional phase-encoded binary scale.
Jong-Ahn Kim, Jae Wan Kim, Chu-Shik Kang, Jonghan Jin

Rev Sci Instrum· April 2018

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Stem Cell Secretome and Its Effect on Cellular Mechanisms Relevant to Wound Healing.
Se-Ra Park, Jae-Wan Kim, Hee-Sook Jun, Joo Young Roh, Hwa-Yong Lee

Mol Ther· February 2018

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An interferometric system for measuring thickness of parallel glass plates without 2π ambiguity using phase analysis of quadrature Haidinger fringes.
Jong-Ahn Kim, Jae Wan Kim, Chu-Shik Kang, Jonghan Jin, Jae Yong Lee

Rev Sci Instrum· May 2017

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High resolution three-dimensional flash LIDAR system using a polarization modulating Pockels cell and a micro-polarizer CCD camera.
Sungeun Jo, Hong Jin Kong, Hyochoong Bang, Jae-Wan Kim, Jomsool Kim

Opt Express· December 2016

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Vibration-insensitive measurements of the thickness profile of large glass panels.
Jungjae Park, Jaeseok Bae, Jonghan Jin, Jong-Ahn Kim, Jae Wan Kim

Opt Express· December 2015

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Fizeau-type interferometric probe to measure geometrical thickness of silicon wafers.
Jonghan Jin, Saerom Maeng, Jungjae Park, Jong-Ahn Kim, Jae Wan Kim

Opt Express· September 2014

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Quadrature laser interferometer for in-line thickness measurement of glass panels using a current modulation technique.
Jong-Ahn Kim, Chu-Shik Kang, Tae Bong Eom, Jonghan Jin, Ho Suhng Suh, Jae Wan Kim

Appl Opt· July 2014

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Vibration-insensitive measurement of thickness variation of glass panels using double-slit interferometry.
Jong-Ahn Kim, Jae Wan Kim, Tae Bong Eom, Jonghan Jin, Chu-Shik Kang

Opt Express· March 2014

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Note: Nonlinearity error compensated absolute planar position measurement using a two-dimensional phase-encoded binary grating.
Jong-Ahn Kim, Jae Wan Kim, Chu-Shik Kang, Jonghan Jin, Tae Bong Eom

Rev Sci Instrum· May 2013

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An optical absolute position measurement method using a phase-encoded single track binary code.
Jong-Ahn Kim, Jae Wan Kim, Chu-Shik Kang, Jonghan Jin, Tae Bong Eom

Rev Sci Instrum· November 2012

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An efficient ray tracing algorithm for the simulation of light trapping effects in Si solar cells with textured surfaces.
Seok Yong Byun, Seok-Joo Byun, Jang Kyo Lee, Jae Wan Kim, Taek Sung Lee, Donghwan Kim, Won Mok Kim

J Nanosci Nanotechnol· April 2012

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Precision depth measurement of through silicon vias (TSVs) on 3D semiconductor packaging process.
Jonghan Jin, Jae Wan Kim, Chu-Shik Kang, Jong-Ahn Kim, Sunghun Lee

Opt Express· February 2012

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Note: high precision angle generator using multiple ultrasonic motors and a self-calibratable encoder.
Jong-Ahn Kim, Jae Wan Kim, Chu-Shik Kang, Jonghan Jin, Tae Bong Eom

Rev Sci Instrum· November 2011

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Note: High speed optical profiler based on a phase-shifting technique using frequency-scanning lasers.
Jong-Ahn Kim, Chu-Shik Kang, Jonghan Jin, Cheon Eom, Roma Jang, Jae Wan Kim

Rev Sci Instrum· August 2011

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High-speed measurement of three-dimensional surface profiles up to 10 μm using two-wavelength phase-shifting interferometry utilizing an injection locking technique.
Roma Jang, Chu-Shik Kang, Jong-Ahn Kim, Jae Wan Kim, Jae-Eun Kim

Appl Opt· April 2011

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Visibility enhanced interferometer based on an injection-locking technique for low reflective materials.
Jonghan Jin, Jae Wan Kim, Chu-Shik Kang, Jong-Ahn Kim

Opt Express· November 2010

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Thickness and refractive index measurement of a silicon wafer based on an optical comb.
Jonghan Jin, Jae Wan Kim, Chu-Shik Kang, Jong-Ahn Kim, Tae Bong Eom

Opt Express· August 2010

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A passive method to compensate nonlinearity in a homodyne interferometer.
Jeongho Ahn, Jong-Ahn Kim, Chu-Shik Kang, Jae Wan Kim, Soohyun Kim

Opt Express· December 2009

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High resolution interferometer with multiple-pass optical configuration.
Jeongho Ahn, Jong-Ahn Kim, Chu-Shik Kang, Jae-Wan Kim, Soohyun Kim

Opt Express· November 2009

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High speed phase shifting interferometry using injection locking of the laser frequency to the resonant modes of a confocal Fabry-Perot cavity.
Chu-Shik Kang, Jong-Ahn Kim, Tae Bong Eom, Roma Jang, Hae Yong Park, Jae-Wan Kim

Opt Express· February 2009

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