Publications by authors named "Jonathan Sanctorum"

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Edge illumination X-ray phase contrast imaging with continuous mask motion.
Ben Huyge, Nicholas Francken, Joaquim G Sanctorum, Jonathan Sanctorum, Jan De Beenhouwer

Opt Express· September 2025

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Gratings for multi-resolution edge illumination X-ray phase contrast imaging: concept and simulation.
Pieter-Jan Vanthienen, Nicholas Francken, Jonathan Sanctorum, Jan Sijbers, Jan De Beenhouwer

Opt Express· April 2025

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Efficient X-ray dark field contrast simulations using a condensed history approach.
Nicholas Francken, Jonathan Sanctorum, Ben Huyge, Jan Sijbers, Jan de Beenhouwer

Opt Express· January 2025

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Inline edge illumination X-ray phase contrast imaging through mask misalignment.
Nicholas Francken, Jonathan Sanctorum, Joaquim Sanctorum, Pieter-Jan Vanthienen, Jan Sijbers

Opt Express· August 2024

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Edge illumination x-ray phase contrast simulations using the CAD-ASTRA toolbox.
Nicholas Francken, Jonathan Sanctorum, Pavel Paramonov, Jan Sijbers, Jan De Beenhouwer

Opt Express· March 2024

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Grating designs for cone beam edge illumination X-ray phase contrast imaging: a simulation study.
Pieter-Jan Vanthienen, Jonathan Sanctorum, Ben Huyge, Nathanaël Six, Jan Sijbers

Opt Express· August 2023

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Fiber Orientation Estimation from X-ray Dark Field Images of Fiber Reinforced Polymers Using Constrained Spherical Deconvolution.
Ben Huyge, Jonathan Sanctorum, Ben Jeurissen, Jan De Beenhouwer, Jan Sijbers

Polymers (Basel)· June 2023

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Virtual grating approach for Monte Carlo simulations of edge illumination-based x-ray phase contrast imaging.
Jonathan Sanctorum, Jan Sijbers, Jan De Beenhouwer

Opt Express· October 2022

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FleXCT: a flexible X-ray CT scanner with 10 degrees of freedom.
Björn De Samber, Jens Renders, Tim Elberfeld, Yves Maris, Jonathan Sanctorum

Opt Express· February 2021

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X-ray phase contrast simulation for grating-based interferometry using GATE.
Jonathan Sanctorum, Jan De Beenhouwer, Jan Sijbers

Opt Express· October 2020

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An alternative approach for ζ-factor measurement using pure element nanoparticles.
Daniele Zanaga, Thomas Altantzis, Jonathan Sanctorum, Bert Freitag, Sara Bals

Ultramicroscopy· May 2016

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