Publications by authors named "Josef Humlicek"

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Treatment of Surface Plasmon Resonance (SPR) Background in Total Internal Reflection Ellipsometry: Characterization of RNA Polymerase II Film Formation.
Dušan Hemzal, Yu Ri Kang, Jan Dvořák, Tomasz Kabzinski, Karel Kubíček

Appl Spectrosc· March 2019

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Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives.
Maria Losurdo, Michael Bergmair, Giovanni Bruno, Denis Cattelan, Christoph Cobet, Josef Humlicek

J Nanopart Res· October 2009

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