Publications by authors named "Kenji Higashida"

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Electrochemical Degradation of Pt-Ni Nanocatalysts: An Identical Location Aberration-Corrected Scanning Transmission Electron Microscopy Study.
Somaye Rasouli, Deborah Myers, Nancy Kariuki, Kenji Higashida, Naotoshi Nakashima

Nano Lett· January 2019

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Transmission electron microscopy of bulk specimens over 10µm in thickness.
Sunao Sadamatsu, Masaki Tanaka, Kenji Higashida, Syo Matsumura

Ultramicroscopy· March 2016

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Crack tip shielding observed with high-resolution transmission electron microscopy.
Damar Rastri Adhika, Masaki Tanaka, Takeshi Daio, Kenji Higashida

Microscopy (Oxf)· October 2015

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A combined environmental straining specimen holder for high-voltage electron microscopy.
Yoshimasa Takahashi, Masaki Tanaka, Kenji Higashida, Kazuhiro Yasuda, Syo Matsumura

Ultramicroscopy· October 2010

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3-D structures of crack-tip dislocations and their shielding effect revealed by electron tomography.
Masaki Tanaka, Masaki Honda, Sunao Sadamatsu, Kenji Higashida

J Electron Microsc (Tokyo)· August 2010

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HVEM study of crack-tip dislocations in Si crystals prepared by FIB and twin-blade cutting method.
Masaki Tanaka, Kenji Higashida, Toru Fukui, Tatsuo Yokote

J Electron Microsc (Tokyo)· March 2005

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HVEM characterization of crack tip dislocations in silicon crystals.
Masaki Tanaka, Kenji Higashida

J Electron Microsc (Tokyo)· January 2005

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