Publications by authors named "Libor Strakos"

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Applications of electron channeling pattern for the determination of wafer offcut and misorientation angles.
Han Han, Libor Strakoš, Clément Porret, Valérie Depauw, Tomáš Vystavěl

Micron· December 2025

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Crystalline defect analysis in epitaxial SiGe layer using site-specific ECCI-STEM.
Han Han, Libor Strakos, Thomas Hantschel, Clement Porret, Tomas Vystavel

Micron· November 2021

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Enhancing the defect contrast in ECCI through angular filtering of BSEs.
Han Han, Thomas Hantschel, Andreas Schulze, Libor Strakos, Tomas Vystavel

Ultramicroscopy· March 2020

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Application of electron channeling contrast imaging to 3D semiconductor structures through proper detector configurations.
Han Han, Thomas Hantschel, Libor Strakos, Tomas Vystavel, Marina Baryshnikova

Ultramicroscopy· March 2020

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Non-destructive characterization of extended crystalline defects in confined semiconductor device structures.
Andreas Schulze, Libor Strakos, Tomas Vystavel, Roger Loo, Antoine Pacco

Nanoscale· April 2018

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