Publications by authors named "Manon Gallard"

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Stress Buildup Upon Crystallization of GeTe Thin Films: Curvature Measurements and Modelling.
Rajkiran Tholapi, Manon Gallard, Nelly Burle, Christophe Guichet, Stephanie Escoubas

Nanomaterials (Basel)· June 2020

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Fast X-ray reflectivity measurements using an X-ray pixel area detector at the DiffAbs beamline, Synchrotron SOLEIL.
Cristian Mocuta, Stefan Stanescu, Manon Gallard, Antoine Barbier, Arkadiusz Dawiec

J Synchrotron Radiat· January 2018

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