Publications by authors named "Martin P Seah"

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Chemical Imaging of Buried Interfaces in Organic-Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry.
Mariavitalia Tiddia, Ichiro Mihara, Martin P Seah, Gustavo Ferraz Trindade, Felix Kollmer

ACS Appl Mater Interfaces· January 2019

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Semiempirical Rules To Determine Drug Sensitivity and Ionization Efficiency in Secondary Ion Mass Spectrometry Using a Model Tissue Sample.
Jean-Luc Vorng, Anna M Kotowska, Melissa K Passarelli, Andrew West, Peter S Marshall, Martin P Seah

Anal Chem· November 2016

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Systematic Temperature Effects in the Argon Cluster Ion Sputter Depth Profiling of Organic Materials Using Secondary Ion Mass Spectrometry.
Martin P Seah, Rasmus Havelund, Ian S Gilmore

J Am Soc Mass Spectrom· August 2016

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Peptide Fragmentation and Surface Structural Analysis by Means of ToF-SIMS Using Large Cluster Ion Sources.
Yuta Yokoyama, Satoka Aoyagi, Makiko Fujii, Jiro Matsuo, John S Fletcher, Martin P Seah

Anal Chem· April 2016

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VAMAS interlaboratory study for desorption electrospray ionization mass spectrometry (DESI MS) intensity repeatability and constancy.
Elzbieta Gurdak, Felicia M Green, Paulina D Rakowska, Martin P Seah, Tara L Salter

Anal Chem· October 2014

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Electron flood gun damage effects in 3D secondary ion mass spectrometry imaging of organics.
Rasmus Havelund, Martin P Seah, Alexander G Shard, Ian S Gilmore

J Am Soc Mass Spectrom· September 2014

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Depth resolution, angle dependence, and the sputtering yield of Irganox 1010 by coronene primary ions.
Martin P Seah, Steve J Spencer, Alex G Shard

J Phys Chem B· October 2013

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Identification and separation of protein, contaminant and substrate peaks using gentle-secondary ion mass spectrometry and the g-ogram.
Satoka Aoyagi, Ian S Gilmore, Ichiro Mihara, Martin P Seah, Ian W Fletcher

Rapid Commun Mass Spectrom· December 2012

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Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study.
Alexander G Shard, Rasmus Havelund, Martin P Seah, Steve J Spencer, Ian S Gilmore

Anal Chem· September 2012

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Modelling of surface nanoparticle inclusions for nanomechanical measurements by an AFM or nanoindenter: spatial issues.
Charles A Clifford, Martin P Seah

Nanotechnology· April 2012

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Nanomechanical measurements of hair as an example of micro-fibre analysis using atomic force microscopy nanoindentation.
Charles A Clifford, Naoko Sano, Peter Doyle, Martin P Seah

Ultramicroscopy· March 2012

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Topography and field effects in secondary ion mass spectrometry--part I: conducting samples.
Joanna L S Lee, Ian S Gilmore, Martin P Seah, Ian W Fletcher

J Am Soc Mass Spectrom· October 2011

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Relationships between cluster secondary ion mass intensities generated by different cluster primary ions.
Martin P Seah, Felicia M Green, Ian S Gilmore

J Am Soc Mass Spectrom· March 2010

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Nanoindentation measurement of Young's modulus for compliant layers on stiffer substrates including the effect of Poisson's ratios.
Charles A Clifford, Martin P Seah

Nanotechnology· April 2009

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G-SIMS: relative effectiveness of different monatomic primary ion source combinations.
Martin P Seah, Ian S Gilmore, Felicia M Green

Rapid Commun Mass Spectrom· March 2009

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Cluster ion beam profiling of organics by secondary ion mass spectrometry--does sodium affect the molecular ion intensity at interfaces?
Felicia M Green, Ian S Gilmore, Martin P Seah

Rapid Commun Mass Spectrom· December 2008

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Imaging G-SIMS: a novel bismuth-manganese source emitter.
Felicia M Green, Felix Kollmer, Ewald Niehuis, Ian S Gilmore, Martin P Seah

Rapid Commun Mass Spectrom· August 2008

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Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS.
Alexander G Shard, Felicia M Green, Paul J Brewer, Martin P Seah, Ian S Gilmore

J Phys Chem B· March 2008

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