Publications by authors named "Matthew E Curd"

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Coupled Broad Ion Beam-Scanning Electron Microscopy (BIB-SEM) for polishing and three dimensional (3D) serial section tomography (SST).
Ali Gholinia, Matthew E Curd, Etienne Bousser, Kevin Taylor, Thijs Hosman

Ultramicroscopyยท July 2020

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