Publications by authors named "Matthias Temmen"

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Improving Eye-Tracking Data Quality: A Framework for Reproducible Evaluation of Detection Algorithms.
Christopher Gundler, Matthias Temmen, Alessandro Gulberti, Monika Pötter-Nerger, Frank Ückert

Sensors (Basel)· April 2024

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Noise in NC-AFM measurements with significant tip-sample interaction.
Jannis Lübbe, Matthias Temmen, Philipp Rahe, Michael Reichling

Beilstein J Nanotechnol· December 2016

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Understanding interferometry for micro-cantilever displacement detection.
Alexander von Schmidsfeld, Tobias Nörenberg, Matthias Temmen, Michael Reichling

Beilstein J Nanotechnol· August 2016

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Determining cantilever stiffness from thermal noise.
Jannis Lübbe, Matthias Temmen, Philipp Rahe, Angelika Kühnle, Michael Reichling

Beilstein J Nanotechnol· April 2013

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Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy.
Jannis Lübbe, Matthias Temmen, Sebastian Rode, Philipp Rahe, Angelika Kühnle

Beilstein J Nanotechnol· February 2013

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