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Publications by authors named "Michael Bartlein"

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X-ray nanodiffraction imaging reveals distinct nanoscopic dynamics of an ultrafast phase transition.
Youngjun Ahn, Mathew J Cherukara, Zhonghou Cai, Michael Bartlein, Tao Zhou

Proc Natl Acad Sci U S A· May 2022


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XTIP - the world's first beamline dedicated to the synchrotron X-ray scanning tunneling microscopy technique.
Volker Rose, Nozomi Shirato, Michael Bartlein, Alex Deriy, Tolulope Ajayi

J Synchrotron Radiat· May 2020


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