Publications by authors named "Michael T Postek"

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Models for an Ultraviolet-C Research and Development Consortium.
Dianne L Poster, Michael T Postek, Yaw S Obeng, John J Kasianowicz, Troy E Cowan

J Res Natl Inst Stand Technol· March 2022

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Broadband Dielectric Spectroscopy as a Potential Label-Free Method to Rapidly Verify Ultraviolet-C Radiation Disinfection.
Yaw S Obeng, Brian J Nablo, Darwin R Reyes, Dianne L Poster, Michael T Postek

J Res Natl Inst Stand Technol· August 2021

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Ultraviolet Radiation Technologies and Healthcare-Associated Infections: Standards and Metrology Needs.
Dianne L Poster, C Cameron Miller, Richard A Martinello, Norman R Horn, Michael T Postek

J Res Natl Inst Stand Technol· August 2021

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Method Development for Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper.
Mary Kombolias, Jan Obrzut, Michael T Postek, Dianne L Poster, Yaw S Obeng

J Vis Exp· October 2019

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Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper Aging.
Mary Kombolias, Jan Obrzut, Michael T Postek, Dianne L Poster, Yaw S Obeng

Anal Lett· January 2019

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Ionizing radiation processing and its potential in advancing biorefining and nanocellulose composite materials manufacturing.
Michael T Postek, Dianne L Poster, András E Vládar, Mark S Driscoll, Jay A LaVerne

Radiat Phys Chem Oxf Engl 1993· February 2018

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Dielectric spectroscopic studies of biological material evolution and application to paper.
Mary Kombolias, Jan Obrzut, Dianne L Poster, Karl Montgomery, Michael T Postek

Tappi J· January 2018

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Innovative Approaches to Combat Healthcare-Associated Infections Using Efficacy Standards Developed Through Industry and Federal Collaboration.
Dianne L Poster, C Cameron Miller, Yaw Obeng, Michael T Postek, Troy E Cowan

Proc SPIE Int Soc Opt Eng· January 2018

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Update on Bio-Refining and Nanocellulose Composite Materials Manufacturing.
Michael T Postek, Dianne L Poster

Proc SPIE Int Soc Opt Eng· August 2017

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Comparison of Electron Imaging Modes for Dimensional Measurements in the Scanning Electron Microscope.
Michael T Postek, András E Vladár, John S Villarrubia, Atsushi Muto

Microsc Microanal· August 2016

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Nanomanufacturing Concerns about Measurements Made in the SEM Part V: Dealing with Noise.
Michael T Postek, András E Vladár

Proc SPIE Int Soc Opt Eng· January 2016

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Does Your SEM Really Tell the Truth?-How Would You Know? Part 4: Charging and its Mitigation.
Michael T Postek, András E Vladár

Proc SPIE Int Soc Opt Eng· October 2015

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Nanomanufacturing Concerns about Measurements Made in the SEM Part IV: Charging and its Mitigation.
Michael T Postek, András E Vladár

Proc SPIE Int Soc Opt Eng· September 2015

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Does your SEM really tell the truth?--How would you know? Part 1.
Michael T Postek, András E Vladár

Scanning· April 2015

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Does your SEM really tell the truth? How would you know? Part 2.
Michael T Postek, András E Vladár, Kavuri P Purushotham

Scanning· April 2015

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Nanoscale reference materials for environmental, health and safety measurements: needs, gaps and opportunities.
Aleksandr B Stefaniak, Vincent A Hackley, Gert Roebben, Kensei Ehara, Steve Hankin, Michael T Postek

Nanotoxicology· December 2013

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Modeling for accurate dimensional scanning electron microscope metrology: then and now.
Michael T Postek, András E Vladár

Scanning· November 2011

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Real-time scanning charged-particle microscope image composition with correction of drift.
Petr Cizmar, András E Vladár, Michael T Postek

Microsc Microanal· April 2011

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Nanostructure fabrication by ultra-high-resolution environmental scanning electron microscopy.
Milos Toth, Charlene J Lobo, W Ralph Knowles, Matthew R Phillips, Michael T Postek

Nano Lett· February 2007

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Nanotip electron gun for the scanning electron microscope.
András E Vladár, Zsolt Radi, Michael T Postek, David C Joy

Scanning· August 2006

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Two-dimensional simulation and modeling in scanning electron microscope imaging and metrology research.
Michael T Postek, András E Vladár, Jeremiah R Lowney, William J Keery

Scanning· August 2002

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Critical Issues in Scanning Electron Microscope Metrology.
Michael T Postek

J Res Natl Inst Stand Technol· January 1994

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X-Ray Lithography Mask Metrology: Use of Transmitted Electrons in an SEM for Linewidth Measurement.
Michael T Postek, Jeremiah R Lowney, Andras E Vladar, William J Keery, Egon Marx

J Res Natl Inst Stand Technol· January 1993

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Interlaboratory Study on the Lithographically Produced Scanning Electron Microscope Magnification Standard Prototype.
Michael T Postek, Andras E Vladar, Samuel N Jones, William J Keery

J Res Natl Inst Stand Technol· January 1993

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