Publications by authors named "Nicholas Ritchie"

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Testing the accuracy of low-beam-energy electron-excited X-ray microanalysis with energy-dispersive spectrometry.
Dale E Newbury, Nicholas W M Ritchie

J Mater Sci· October 2024

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Quantification of Unsupported Thin-Film X-ray Spectra Using Bulk Standards.
Nicholas W M Ritchie, Andrew Herzing, Vladimir P Oleshko

Microsc Microanal· December 2023

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Registering Particle Data Sets Using a Rotation and Translation Invariant Nearest-Neighbor Algorithm.
Nicholas W M Ritchie, Scott Wight, Diana Ortiz-Montalvo, Abigail P Lindstrom

Microsc Microanal· April 2023

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Energy-Dispersive X-Ray Spectrum Simulation with NIST DTSA-II: Comparing Simulated and Measured Electron-Excited Spectra.
Dale E Newbury, Nicholas W M Ritchie

Microsc Microanal· September 2022

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Reproducible Spectrum and Hyperspectrum Data Analysis Using NeXL.
Nicholas W M Ritchie

Microsc Microanal· March 2022

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Acceptance Testing Methodology for the Production of Standard Reference Material 2806: Medium Test Dust in Hydraulic Fluid.
Robert Fletcher, James Filliben, Nicholas Ritchie, Nicolas Petillon

J Res Natl Inst Stand Technol· February 2022

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Simulating electron-excited energy dispersive X-ray spectra with the NIST DTSA-II open-source software platform.
Dale E Newbury, Nicholas W M Ritchie

MRS Adv· January 2022

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Quantitative Electron-Excited X-ray Microanalysis With Low-Energy L-shell X-ray Peaks Measured With Energy-Dispersive Spectrometry.
Dale E Newbury, Nicholas W M Ritchie

Microsc Microanal· September 2021

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Embracing Uncertainty: Modeling Uncertainty in EPMA-Part II.
Nicholas W M Ritchie

Microsc Microanal· February 2021

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Embracing Uncertainty: Modeling the Standard Uncertainty in Electron Probe Microanalysis-Part I.
Nicholas W M Ritchie

Microsc Microanal· June 2020

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Electron-Excited X-ray Microanalysis by Energy Dispersive Spectrometry at 50: Analytical Accuracy, Precision, Trace Sensitivity, and Quantitative Compositional Mapping.
Dale E Newbury, Nicholas W M Ritchie

Microsc Microanal· October 2019

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An Iterative Qualitative-Quantitative Sequential Analysis Strategy for Electron-Excited X-ray Microanalysis with Energy Dispersive Spectrometry: Finding the Unexpected Needles in the Peak Overlap Haystack.
Dale E Newbury, Nicholas W M Ritchie

Microsc Microanal· August 2018

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Overcoming Peak Overlaps in Titanium- and Vanadium-Bearing Materials with Multiple Linear Least Squares Fitting.
Michael Mengason, Nicholas Ritchie

Microsc Microanal· June 2017

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Efficient Simulation of Secondary Fluorescence Via NIST DTSA-II Monte Carlo.
Nicholas W M Ritchie

Microsc Microanal· June 2017

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Certification of New Standard Reference Material 2806b Medium Test Dust in Hydraulic Fluid.
Robert Fletcher, Nicholas Ritchie, David Bright, James Filliben, William Guthrie

J Res Natl Inst Stand Technol· December 2016

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Electron-Excited X-Ray Microanalysis at Low Beam Energy: Almost Always an Adventure!
Dale E Newbury, Nicholas W M Ritchie

Microsc Microanal· August 2016

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Measurement of Trace Constituents by Electron-Excited X-Ray Microanalysis with Energy-Dispersive Spectrometry.
Dale E Newbury, Nicholas W M Ritchie

Microsc Microanal· June 2016

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Diluvian Clustering: A Fast, Effective Algorithm for Clustering Compositional and Other Data.
Nicholas W M Ritchie

Microsc Microanal· October 2015

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Quantitative Electron-Excited X-Ray Microanalysis of Borides, Carbides, Nitrides, Oxides, and Fluorides with Scanning Electron Microscopy/Silicon Drift Detector Energy-Dispersive Spectrometry (SEM/SDD-EDS) and NIST DTSA-II.
Dale E Newbury, Nicholas W M Ritchie

Microsc Microanal· October 2015

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Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS).
Dale E Newbury, Nicholas W M Ritchie

J Mater Sci· November 2014

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Is scanning electron microscopy/energy dispersive X-ray spectrometry (SEM/EDS) quantitative?
Dale E Newbury, Nicholas W M Ritchie

Scanning· December 2013

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Use of force-sensing array films to improve surface wipe sampling.
Jennifer R Verkouteren, Nicholas W M Ritchie, Greg Gillen

Environ Sci Process Impacts· February 2013

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Uncertainty estimates for electron probe X-ray microanalysis measurements.
Nicholas W M Ritchie, Dale E Newbury

Anal Chem· November 2012

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EDS measurements of X-ray intensity at WDS precision and accuracy using a silicon drift detector.
Nicholas W M Ritchie, Dale E Newbury, Jeffrey M Davis

Microsc Microanal· August 2012

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Compton scattering artifacts in electron excited X-ray spectra measured with a silicon drift detector.
Nicholas W M Ritchie, Dale E Newbury, Abigail P Lindstrom

Microsc Microanal· December 2011

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