Publications by authors named "Peter Cumpson"

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Copper-Indium Binary Catalyst on a Gas Diffusion Electrode for High-Performance CO Electrochemical Reduction with Record CO Production Efficiency.
Hang Xiang, Shahid Rasul, Bo Hou, Jose Portoles, Peter Cumpson

ACS Appl Mater Interfaces· January 2020

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Combining thermal hydrolysis and methylation-gas chromatography/mass spectrometry with X-ray photoelectron spectroscopy to characterise complex organic assemblages in geological material.
Graham Purvis, Naoko Sano, Cees van der Land, Anders Barlow, Elisa Lopez-Capel, Peter Cumpson

MethodsX· November 2019

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Enhanced Ion Yields Using High Energy Water Cluster Beams for Secondary Ion Mass Spectrometry Analysis and Imaging.
Sadia Sheraz, Hua Tian, John C Vickerman, Paul Blenkinsopp, Nicholas Winograd, Peter Cumpson

Anal Chem· July 2019

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The organic stratigraphy of Ontong Java Plateau Tuff correlated with the depth-related presence and absence of putative microbial alteration structures.
Graham Purvis, Cees van der Land, Naoko Sano, Charles Cockell, Anders Barlow, Peter Cumpson

Geobiology· May 2019

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Demonstration of chemistry at a point through restructuring and catalytic activation at anchored nanoparticles.
Dragos Neagu, Evangelos I Papaioannou, Wan K W Ramli, David N Miller, Billy J Murdoch, Peter J Cumpson

Nat Commun· November 2017

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Voltage Controlled Hot Carrier Injection Enables Ohmic Contacts Using Au Island Metal Films on Ge.
Srinivas Ganti, Peter J King, Erhan Arac, Karl Dawson, Mikko J Heikkilä, Peter Cumpson

ACS Appl Mater Interfaces· August 2017

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Removing Beam Current Artifacts in Helium Ion Microscopy: A Comparison of Image Processing Techniques.
Anders J Barlow, Jose F Portoles, Naoko Sano, Peter J Cumpson

Microsc Microanal· October 2016

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Oxygen reduction reaction by electrochemically reduced graphene oxide.
Santosh Kumar Bikkarolla, Peter Cumpson, Paul Joseph, Pagona Papakonstantinou

Faraday Discuss· May 2015

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A compact torsional reference device for easy, accurate and traceable AFM piconewton calibration.
Jose F Portoles, Peter J Cumpson

Nanotechnology· August 2013

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Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI.
Peter J Cumpson, John Hedley

Nanotechnology· December 2003

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