Publications by authors named "Philippe Jonnard"

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High-accuracy experimental determination of photon mass attenuation coefficients of transition metals and lithium fluoride in the ultra-soft energy range.
Pia Schweizer, Yves Ménesguen, Marie-Christine Lépy, Emmanuelle Brackx, Maxime Duchateau, Philippe Jonnard

Phys Chem Chem Phys· April 2024

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Study of interface reaction in a BC/Cr mirror at elevated temperature using soft X-ray reflectivity.
Mohammed H Modi, Shruti Gupta, Praveen K Yadav, Rajkumar Gupta, Aniruddha Bose, Philippe Jonnard

J Synchrotron Radiat· July 2022

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A Simple Approach for Thickness Measurements Using Electron Probe Microanalysis.
Mouad Essani, Victor Krawiec, Emmanuelle Brackx, Emmanuel Excoffier, Philippe Jonnard

Microsc Microanal· April 2021

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Improving the soft X-ray reflectivity of Cr/Ti multilayers by co-deposition of BC.
Jingtao Zhu, Jiayi Zhang, Haochuan Li, Yuchun Tu, Jinwen Chen, Philippe Jonnard

J Synchrotron Radiat· November 2020

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Characterization of the Chemical Composition of Uranium Microparticles with Irregular Shapes Using Standardless Electron Probe Microanalysis and Micro-Raman Spectrometry.
Mouad Essani, Emmanuelle Brackx, Fabien Pointurier, Faustine Berthy, Emmanuel Excoffier, Philippe Jonnard

Anal Chem· June 2020

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Realization of wafer-scale nanogratings with sub-50 nm period through vacancy epitaxy.
Qiushi Huang, Qi Jia, Jiangtao Feng, Hao Huang, Xiaowei Yang, Philippe Jonnard

Nat Commun· June 2019

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Kossel Effect in Periodic Multilayers.
Karine Le Guen, Jean-Michel André, Meiyi Wu, Vita Ilakovac, Franck Delmotte, Philippe Jonnard

J Nanosci Nanotechnol· January 2019

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Note: Observation of the angular distribution of an x-ray characteristic emission through a periodic multilayer.
Philippe Jonnard, Meiyi Wu, Jean-Michel André, Karine Le Guen, Zhanshan Wang

Rev Sci Instrum· September 2018

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High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region.
Qiushi Huang, Qiang Yi, Zhaodong Cao, Runze Qi, Rolf A Loch, Philippe Jonnard

Sci Rep· October 2017

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EUV stimulated emission from MgO pumped by FEL pulses.
Philippe Jonnard, Jean-Michel André, Karine Le Guen, Meiyi Wu, Emiliano Principi

Struct Dyn· September 2017

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Nitridated Pd/BC multilayer mirrors for soft X-ray region: internal structure and aging effects.
Yiwen Wang, Qiushi Huang, Qiang Yi, Igor V Kozhevnikov, Runze Qi, Philippe Jonnard

Opt Express· April 2017

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Ultra-short and ultra-intense X-ray free-electron laser single pulse in one-dimensional photonic crystals.
Jean Michel André, Philippe Jonnard

J Synchrotron Radiat· March 2017

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High reflectance Cr/V multilayer with B(4)C barrier layer for water window wavelength region.
Qiushi Huang, Jiani Fei, Yang Liu, Pin Li, Mingwu Wen, Philippe Jonnard

Opt Lett· February 2016

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Enhancement of soft X-ray reflectivity and interface stability in nitridated Pd/Y multilayer mirrors.
Dechao Xu, Qiushi Huang, Yiwen Wang, Pin Li, Mingwu Wen, Philippe Jonnard

Opt Express· December 2015

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X-ray fluorescence induced by standing waves in the grazing-incidence and grazing-exit modes: study of the Mg-Co-Zr system.
Yuchun Tu, Yanyan Yuan, Karine Le Guen, Jean Michel André, Jingtao Zhu, Philippe Jonnard

J Synchrotron Radiat· November 2015

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Enhancement of the reflectivity of Al/Zr multilayers by a novel structure.
Qi Zhong, Zhong Zhang, Runze Qi, Jia Li, Zhanshan Wang, Philippe Jonnard

Opt Express· June 2013

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Optical and structural performance of the Al(1%wtSi)/Zr reflection multilayers in the 17-19nm region.
Qi Zhong, Wenbin Li, Zhong Zhang, Jingtao Zhu, Qiushi Huang, Philippe Jonnard

Opt Express· May 2012

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Thermal stability of Mg/Co multilayer with B4C, Mo or Zr diffusion barrier layers.
Jingtao Zhu, Sika Zhou, Haochuan Li, Zhanshan Wang, Philippe Jonnard

Opt Express· October 2011

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Structural properties of Al/Mo/SiC multilayers with high reflectivity for extreme ultraviolet light.
Min-Hui Hu, Karine Le Guen, Jean-Michel André, Philippe Jonnard, Evgueni Meltchakov

Opt Express· September 2010

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Comparison of Mg-based multilayers for solar He II radiation at 30.4 nm wavelength.
Jingtao Zhu, Sika Zhou, Haochuan Li, Qiushi Huang, Zhanshan Wang, Philippe Jonnard

Appl Opt· July 2010

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Characterization of Al and Mg alloys from their X-ray emission bands.
Philippe Jonnard, Karine Le Guen, Raynald Gauvin, Jean-François Le Berre

Microsc Microanal· February 2009

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