Publications by authors named "Pyungho Choi"

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E
Effects of polyimide curing on image sticking behaviors of flexible displays.
Hyojung Kim, Jongwoo Park, Sora Bak, Jungmin Park, Changwoo Byun, Pyungho Choi, Byoungdeog Choi

Sci Rep· November 2021

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Negative Bias Instability of InZnO-Based Thin-Film Transistors Under Illumination Stress.
Sangmin Lee, Pyungho Choi, Minjun Song, Gaeun Lee, Nara Lee, Byoungdeog Choi

J Nanosci Nanotechnol· August 2021

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Leakage Current Analysis Method for Metal Insulator Semiconductor Capacitors Through Low-Frequency Noise Measurement.
Hyojung Kim, Jongwoo Park, Junehwan Kim, Nara Lee, Gaeun Lee, Pyungho Choi, Byoungdeog Choi

J Nanosci Nanotechnol· March 2021

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Hydrogen Permeation and Its Impacts on the Electrical Performance of Stacked ZrO₂/Al₂O₃/ZrO₂ Films.
Pyungho Choi, Youngseung Cho, Byoungdeog Choi

J Nanosci Nanotechnol· November 2020

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Solution-Based Indium-Zinc Oxide/Indium-Gallium-Zinc Oxide Double-Channel Thin-Film Transistors with Incorporated Hydrogen Peroxide.
Woojin Jeon, Pyungho Choi, Areum Park, Donghyeon Lee, Donghee Choi, Byoungdeog Choi

J Nanosci Nanotechnol· November 2020

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Hafnium Incorporation in InZnO Thin Film Transistors as a Carrier Suppressor.
Donghyeon Lee, Pyungho Choi, Areum Park, Woojin Jeon, Donghee Choi, Byoungdeog Choi

J Nanosci Nanotechnol· November 2020

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Defect Analysis and Reliability Characteristics of (HfZrO₄)(SiO₂) High- Dielectrics.
Areum Park, Pyungho Choi, Woojin Jeon, Donghyeon Lee, Donghee Choi, Byoungdeog Choi

J Nanosci Nanotechnol· November 2020

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Effect of Heat Budget After Capacitor Formation on the Leakage Current Characteristics of ZrO₂-Based High- Dielectrics for Next-Generation Dynamic Random-Access Memory Capacitors.
Jong-Min Lee, Pyung-Ho Choi, Jong-Beom Seo, Byoung-Deog Choi

J Nanosci Nanotechnol· January 2020

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Reliability Improvement in Solution-Processed ZrO₂ Dielectrics Due to Addition of H₂O₂.
Minsoo Kim, Pyungho Choi, Jeonghyun Lee, Kiwon Lim, Younghwan Hyeon, Byoungdeog Choi

J Nanosci Nanotechnol· September 2018

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Incorporation of Si and Zr into Pure HfO₂ and Its Effects on Dielectric Integrity.
Hyunki Kim, Pyungho Choi, Nayoung Lee, Soonkon Kim, Kwangjun Koo, Byoungdeog Choi

J Nanosci Nanotechnol· September 2018

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Investigation of the Charge Balance in Green Phosphorescent Organic Light-Emitting Diodes by Controlling the Mixed Host Emission Layer.
Jeonghyun Lee, Pyungho Choi, Minsoo Kim, Kiwon Lim, Younghwan Hyeon, Byoungdeog Choi

J Nanosci Nanotechnol· September 2018

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Optimization of the Solution-Based Indium-Zinc Oxide/Zinc-Tin Oxide Channel Layer for Thin-Film Transistors.
Kiwon Lim, Pyungho Choi, Sangsub Kim, Hyunki Kim, Minsoo Kim, Byoungdeog Choi

J Nanosci Nanotechnol· September 2018

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Electrical Characterization of Charge Polarity in AlF₃ Anti-Reflection Layers for Complementary Metal Oxide Semiconductor Image Sensors.
Younghwan Hyeon, Pyungho Choi, Sangsub Kim, Minsoo Kim, Jeonghyun Lee, Byoungdeog Choi

J Nanosci Nanotechnol· September 2018

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Defect visualization of Cu(InGa)(SeS)2 thin films using DLTS measurement.
Sung Heo, JaeGwan Chung, Hyung-Ik Lee, Junho Lee, Jong-Bong Park, Pyung-Ho Choi, Byoung-Deog Choi

Sci Rep· August 2016

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Analysis of the Electrical Properties of an Electron Injection Layer in Alq3-Based Organic Light Emitting Diodes.
Soonkon Kim, Pyungho Choi, Sangsub Kim, Hyoungsun Park, Dohyun Baek, Byoungdeog Choi

J Nanosci Nanotechnol· May 2016

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Fabrication and Characteristics of High Mobility InSnZnO Thin Film Transistors.
Pyungho Choi, Junki Lee, Hyoungsun Park, Dohyun Baek, Jaehyeong Lee, Byoungdeog Choi

J Nanosci Nanotechnol· May 2016

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Trap Profiling Based on Frequency Varied Charge Pumping Method for Hot Carrier Stressed Thin Gate Oxide Metal Oxide Semiconductors Field Effect Transistors.
Pyungho Choi, Hyunjin Kim, Sangsub Kim, Soonkon Kim, Reza Javadi, Byoungdeog Choi

J Nanosci Nanotechnol· May 2016

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Performance degradation of c-Si solar cells under UV exposure.
Hyojung Kim, Pyungho Choi, Kwangsoo Kim, Hyungsuk Kuh, Dohyun Beak, Byoungdeog Choi

J Nanosci Nanotechnol· May 2014

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