Publications by authors named "RA Neiser"

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X-ray-absorption fine-structure measurement of single-crystal materials.
KH Kim, WT Elam, EF Skelton, JP Kirkland, RA Neiser

Phys Rev B Condens Matter· December 1990

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Depth dependence for extended x-ray-absorption fine-structure spectroscopy detected via electron yield in He and in vacuum.
WT Elam, JP Kirkland, RA Neiser, PD Wolf

Phys Rev B Condens Matter· July 1988

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