Publications by authors named "Remco Geurts"

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FIB-SEM: Emerging Multimodal/Multiscale Characterization Techniques for Advanced Battery Development.
Zhao Liu, Shuang Bai, Sven Burke, James N Burrow, Remco Geurts

Chem Rev· June 2025

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Evaluating focused ion beam induced damage in soft materials.
Russell J Bailey, Remco Geurts, Debbie J Stokes, Frank de Jong, Asa H Barber

Micron· July 2013

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High-quality sample preparation by low kV FIB thinning for analytical TEM measurements.
Sara Bals, Wim Tirry, Remco Geurts, Zhiqing Yang, Dominique Schryvers

Microsc Microanal· April 2007

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