Publications by authors named "Roger P Netterfield"

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Measuring the thickness profiles of wafers to subnanometer resolution using Fabry-Perot interferometry.
David I Farrant, John W Arkwright, Philip S Fairman, Roger P Netterfield

Appl Opt· May 2007

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Mechanical characteristics of optical coatings prepared by various techniques: a comparative study.
Jolanta E Klemberg-Sapieha, Jörg Oberste-Berghaus, Ludvik Martinu, Richard Blacker, Ian Stevenson, Roger P Netterfield

Appl Opt· May 2004

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