Publications by authors named "Sook Fun Chan"

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Comparing three quantification methods on N/Si ratio analysis using electron energy loss spectroscopy (EELS).
Xue Rui, Yun-Yu Wang, Shixin Wang, Sook Fun Chan, Qiang Jin

Micron· June 2022

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A method of using Si L-edge for O/Si and N/Si quantitative ratio analysis by electron energy loss spectroscopy (EELS).
Yun-Yu Wang, Sook Fun Chan, Qiang Jin, Kent Zhuang, Jae Kyu Choi

Micron· July 2021

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