Publications by authors named "Stephane Perrin"

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Evanescent point sources: application to microsphere-assisted super-resolution microscopy.
Rayenne Boudoukha, Stéphane Perrin, Assia Guessoum, Nacer-E Demagh, Paul Montgomery

Opt Lett· November 2024

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Roadmap on Label-Free Super-Resolution Imaging.
Vasily N Astratov, Yair Ben Sahel, Yonina C Eldar, Luzhe Huang, Aydogan Ozcan, Stephane Perrin

Laser Photon Rev· December 2023

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Electrochemical Behavior of Al/Mg Alloys Immobilized in a Magnesium Potassium Phosphate Cement-Based Mortar.
Gabriel Poras, Céline Cau Dit Coumes, Pascal Antonucci, Céline Cannes, Sylvie Delpech, Stéphane Perrin

Materials (Basel)· August 2023

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Direct imaging of a photonic jet at shaped fiber tips.
Djamila Bouaziz, Stephane Perrin, Tony Hajj, Grégoire Chabrol, Assia Guessoum

Opt Lett· October 2021

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Illumination conditions in microsphere-assisted microscopy.
Stephane Perrin, Hongyu Li, Audrey Leong-Hoi, Sylvain Lecler, Paul Montgomery

J Microsc· April 2019

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Photonic jet lens.
Sylvain Lecler, Stephane Perrin, Audrey Leong-Hoi, Paul Montgomery

Sci Rep· March 2019

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Microsphere-assisted phase-shifting profilometry.
Stephane Perrin, Audrey Leong-Hoï, Sylvain Lecler, Pierre Pfeiffer, Ivan Kassamakov

Appl Opt· September 2017

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Wafer-level fabrication of multi-element glass lenses: lens doublet with improved optical performances.
Jorge Albero, Stéphane Perrin, Nicolas Passilly, Johann Krauter, Ludovic Gauthier-Manuel

Opt Lett· January 2016

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Simple method based on intensity measurements for characterization of aberrations from micro-optical components.
Stephane Perrin, Maciej Baranski, Luc Froehly, Jorge Albero, Nicolas Passilly

Appl Opt· November 2015

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Dense arrays of millimeter-sized glass lenses fabricated at wafer-level.
Jorge Albero, Stéphane Perrin, Sylwester Bargiel, Nicolas Passilly, Maciej Baranski

Opt Express· May 2015

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Impact of mirror spider legs on imaging quality in Mirau micro-interferometry.
Justine Lullin, Stephane Perrin, Maciej Baranski, Sylwester Bargiel, Luc Froehly

Opt Lett· May 2015

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A simple method for quality evaluation of micro-optical components based on 3D IPSF measurement.
Maciej Baranski, Stephane Perrin, Nicolas Passilly, Luc Froehly, Jorge Albero

Opt Express· June 2014

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