Publications by authors named "Yusin Yang"

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Non-contact and nanometer-scale measurement of PN junction depth buried in Si wafers using terahertz emission spectroscopy.
Fumikazu Murakami, Shinji Ueyama, Kenji Suzuki, Ingi Kim, Inkeun Baek, Yusin Yang

Light Sci Appl· June 2025

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Near-field terahertz time-domain spectroscopy for in-line electrical metrology of semiconductor integration processes for memory.
Sunhong Jun, Inkeun Baek, Suhwan Park, Eun Hyuk Choi, Jongmin Yoon, Yusin Yang

Commun Eng· February 2025

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Microsphere-assisted hyperspectral imaging: super-resolution, non-destructive metrology for semiconductor devices.
Jangryul Park, Youngsun Choi, Soonyang Kwon, Youngjun Lee, Jiwoong Kim, Yusin Yang

Light Sci Appl· May 2024

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Fourier ptychographic topography.
Hao Wang, Jiabei Zhu, Jangwoon Sung, Guorong Hu, Joseph Greene, Yusin Yang

Opt Express· March 2023

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Fast, exact, and non-destructive diagnoses of contact failures in nano-scale semiconductor device using conductive AFM.
ChaeHo Shin, Kyongjun Kim, JeongHoi Kim, Wooseok Ko, Yusin Yang

Sci Rep· October 2013

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