Publications by authors named "Aaditya Bhat"

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Sensitivity of multislice electron ptychography to point defects: A case study in SiC.
Aaditya Bhat, Colin Gilgenbach, Junghwa Kim, Michael Xu, Menglin Zhu

Ultramicroscopy· February 2026

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Quantifying Implantation-Induced Damage and Point Defects with Multislice Electron Ptychography.
Junghwa Kim, Colin Gilgenbach, Aaditya Bhat, James M LeBeau

Nano Lett· April 2025

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