Publications by authors named "Colin Gilgenbach"

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Sensitivity of multislice electron ptychography to point defects: A case study in SiC.
Aaditya Bhat, Colin Gilgenbach, Junghwa Kim, Michael Xu, Menglin Zhu

Ultramicroscopy· February 2026

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Optimizing Atomic Number Contrast in Multislice Electron Ptychography.
Bridget R Denzer, Colin Gilgenbach, James M LeBeau

Microsc Microanal· September 2025

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Quantifying Implantation-Induced Damage and Point Defects with Multislice Electron Ptychography.
Junghwa Kim, Colin Gilgenbach, Aaditya Bhat, James M LeBeau

Nano Lett· April 2025

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Insights into Chemical and Structural Order at Planar Defects in PbMgWO Using Multislice Electron Ptychography.
Menglin Zhu, Michael Xu, Yu Yun, Liyan Wu, Or Shafir, Colin Gilgenbach

ACS Nano· February 2025

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Revealing the Interplay of Local Environments and Ionic Transport in Perovskite Solid Electrolytes.
Junghwa Kim, Kiarash Gordiz, Daniele Vivona, Lambert Hu, Colin Gilgenbach

ACS Nano· November 2024

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A Methodology for Robust Multislice Ptychography.
Colin Gilgenbach, Xi Chen, James M LeBeau

Microsc Microanal· August 2024

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