Publications by authors named "Benoit Bakeroot"

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Development and analysis of thick GaN drift layers on 200 mm CTE-matched substrate for vertical device processing.
Walter Gonçalez Filho, Matteo Borga, Karen Geens, Deepthi Cingu, Urmimala Chatterjee, Benoit Bakeroot

Sci Rep· September 2023

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Understanding the Leakage Mechanisms and Breakdown Limits of Vertical GaN-on-Si pnn Diodes: The Road to Reliable Vertical MOSFETs.
Kalparupa Mukherjee, Carlo De Santi, Matteo Buffolo, Matteo Borga, Shuzhen You, Benoit Bakeroot

Micromachines (Basel)· April 2021

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Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization.
Kalparupa Mukherjee, Carlo De Santi, Matteo Borga, Karen Geens, Shuzhen You, Benoit Bakeroot

Materials (Basel)· April 2021

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Surface-Potential-Based Compact Modeling of p-GaN Gate HEMTs.
Jie Wang, Zhanfei Chen, Shuzhen You, Benoit Bakeroot, Jun Liu

Micromachines (Basel)· February 2021

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Use of Bilayer Gate Insulator in GaN-on-Si Vertical Trench MOSFETs: Impact on Performance and Reliability.
Kalparupa Mukherjee, Carlo De Santi, Matteo Borga, Shuzhen You, Karen Geens, Benoit Bakeroot

Materials (Basel)· October 2020

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