Publications by authors named "Shuzhen You"

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Improved selectivity in dry etching of lithium niobate with thermal annealed hydrogen silsesquioxane mask.
Songyan Hou, Chengyi Zhu, Jiajun Zhang, Mengfang Xu, Haoxuan Xiao, Shuzhen You

Nanotechnology· November 2025

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750 V Breakdown in GaN Buffer on 200 mm SOI Substrates Using Reverse-Stepped Superlattice Layers.
Shuzhen You, Yilong Lei, Liang Wang, Xing Chen, Ting Zhou

Micromachines (Basel)· November 2024

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A CMOS-Compatible Process for ≥3 kV GaN Power HEMTs on 6-inch Sapphire Using In Situ SiN as the Gate Dielectric.
Jie Zhang, Xiangdong Li, Jian Ji, Shuzhen You, Long Chen

Micromachines (Basel)· August 2024

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Highly Responsive Gate-Controlled p-GaN/AlGaN/GaN Ultraviolet Photodetectors with a High-Transmittance Indium Tin Oxide Gate.
Zhanfei Han, Xiangdong Li, Hongyue Wang, Yuebo Liu, Weitao Yang, Shuzhen You

Micromachines (Basel)· January 2024

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Revealing the Mechanism of the Bias Temperature Instability Effect of p-GaN Gate HEMTs by Time-Dependent Gate Breakdown Stress and Fast Sweeping Characterization.
Xiangdong Li, Meng Wang, Jincheng Zhang, Rui Gao, Hongyue Wang, Shuzhen You

Micromachines (Basel)· May 2023

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Investigating the Failure Mechanism of p-GaN Gate HEMTs under High Power Stress with a Transparent ITO Gate.
Zhanfei Han, Xiangdong Li, Hongyue Wang, Jiahui Yuan, Junbo Wang, Shuzhen You

Micromachines (Basel)· April 2023

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Understanding the Leakage Mechanisms and Breakdown Limits of Vertical GaN-on-Si pnn Diodes: The Road to Reliable Vertical MOSFETs.
Kalparupa Mukherjee, Carlo De Santi, Matteo Buffolo, Matteo Borga, Shuzhen You

Micromachines (Basel)· April 2021

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Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization.
Kalparupa Mukherjee, Carlo De Santi, Matteo Borga, Karen Geens, Shuzhen You

Materials (Basel)· April 2021

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Surface-Potential-Based Compact Modeling of p-GaN Gate HEMTs.
Jie Wang, Zhanfei Chen, Shuzhen You, Benoit Bakeroot, Jun Liu

Micromachines (Basel)· February 2021

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Use of Bilayer Gate Insulator in GaN-on-Si Vertical Trench MOSFETs: Impact on Performance and Reliability.
Kalparupa Mukherjee, Carlo De Santi, Matteo Borga, Shuzhen You, Karen Geens

Materials (Basel)· October 2020

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MhNCED3 in Malus hupehensis Rehd. induces NO generation under osmotic stress by regulating ABA accumulation.
Wei-wei Zhang, Hong-qiang Yang, Shu-zhen You, Kun Ran

Plant Physiol Biochem· November 2015

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MhNCED3, a gene encoding 9-cis-epoxycarotenoid dioxygenase in Malus hupehensis Rehd., enhances plant tolerance to Cl- stress by reducing Cl- accumulation.
Wei-wei Zhang, Hong-qiang Yang, Shu-zhen You, Shu-lei Fan, Kun Ran

Plant Physiol Biochem· April 2015

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[Effects of cadmium stress on fatty acid composition and lipid peroxidation of Malus hupehensis].
Shu-Zhen You, Hong-Qiang Yang, Long Zhang, Xiao-Jie Shao

Ying Yong Sheng Tai Xue Bao· August 2009

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[Effects of CdCl2 on grape root mitochondrial characteristics and root activity].
Xiao-Jie Shao, Hong-Qiang Yang, Hai-Tao Qiao, Long Zhang, Shu-Zhen You

Ying Yong Sheng Tai Xue Bao· June 2009

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