Publications by authors named "Ivan Ohlidal"

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Optical characterization of inhomogeneity of polymer-like thin films arising in the initial phase of plasma-enhanced chemical vapor deposition.
Jan Dvořák, Jiří Vohánka, Vilma Buršíková, Ivan Ohlídal

Heliyon· March 2024

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Optical characterization of inhomogeneous thin films with randomly rough boundaries exhibiting wide intervals of spatial frequencies.
Ivan Ohlídal, Jiří Vohánka, Vilma Buršíková, Jan Dvořák, Petr Klapetek

Opt Express· October 2022

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Optical characterization of inhomogeneous thin films with randomly rough boundaries.
Jiří Vohánka, Ivan Ohlídal, Vilma Buršíková, Petr Klapetek, Nupinder Jeet Kaur

Opt Express· January 2022

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Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films.
Ivan Ohlídal, Jiří Vohánka, Vilma Buršíková, Václav Šulc, Štěpán Šustek

Opt Express· November 2020

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Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials.
Jiří Vohánka, Daniel Franta, Martin Čermák, Vojtěch Homola, Vilma Buršíková

Opt Express· February 2020

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Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers.
Ivan Ohlídal, Jiří Vohánka, Vilma Buršíková, Daniel Franta, Martin Čermák

Opt Express· January 2020

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Universal dispersion model for characterization of optical thin films over a wide spectral range: application to hafnia.
Daniel Franta, David Nečas, Ivan Ohlídal

Appl Opt· November 2015

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Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films.
David Nečas, Ivan Ohlídal, Daniel Franta, Miloslav Ohlídal, Vladimír Čudek

Appl Opt· September 2014

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Consolidated series for efficient calculation of the reflection and transmission in rough multilayers.
David Nečas, Ivan Ohlídal

Opt Express· February 2014

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Influence of cross-correlation effects on the optical quantities of rough films.
Daniel Franta, Ivan Ohlídal, David Necas

Opt Express· May 2008

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Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces.
Petr Klapetek, Ivan Ohlídal, Jindrich Bílek

Ultramicroscopy· December 2004

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Theoretical analysis of the atomic force microscopy characterization of columnar thin films.
Petr Klapetek, Ivan Ohlídal

Ultramicroscopy· January 2003

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