Publications by authors named "Stepan Sustek"

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Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films.
Ivan Ohlídal, Jiří Vohánka, Vilma Buršíková, Václav Šulc, Štěpán Šustek

Opt Express· November 2020

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