Publications by authors named "Joff Derluyn"

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Low Buffer Trapping Effects above 1200 V in Normally off GaN-on-Silicon Field Effect Transistors.
Idriss Abid, Youssef Hamdaoui, Jash Mehta, Joff Derluyn, Farid Medjdoub

Micromachines (Basel)· September 2022

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The impact of dislocations on AlGaN/GaN Schottky diodes and on gate failure of high electron mobility transistors.
Sven Besendörfer, Elke Meissner, Farid Medjdoub, Joff Derluyn, Jochen Friedrich

Sci Rep· October 2020

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High Breakdown Voltage and Low Buffer Trapping in Superlattice GaN-on-Silicon Heterostructures for High Voltage Applications.
Alaleh Tajalli, Matteo Meneghini, Sven Besendörfer, Riad Kabouche, Idriss Abid, Joff Derluyn

Materials (Basel)· September 2020

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Vertical Leakage in GaN-on-Si Stacks Investigated by a Buffer Decomposition Experiment.
Alaleh Tajalli, Matteo Borga, Matteo Meneghini, Carlo De Santi, Davide Benazzi, Joff Derluyn

Micromachines (Basel)· January 2020

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Exploring possibilities of band gap measurement with off-axis EELS in TEM.
Svetlana Korneychuk, Bart Partoens, Giulio Guzzinati, Rajesh Ramaneti, Joff Derluyn

Ultramicroscopy· June 2018

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