Publications by authors named "Laura Anoldo"

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Positive Bias Temperature Instability in SiC-Based Power MOSFETs.
Vladislav Volosov, Santina Bevilacqua, Laura Anoldo, Giuseppe Tosto, Enzo Fontana

Micromachines (Basel)· June 2024

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4H-SiC MOSFET Threshold Voltage Instability Evaluated via Pulsed High-Temperature Reverse Bias and Negative Gate Bias Stresses.
Laura Anoldo, Edoardo Zanetti, Walter Coco, Alfio Russo, Patrick Fiorenza

Materials (Basel)· April 2024

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