logo-large
  • Browse Categories

Publications by authors named "Walter Coco"

Claim this Profile
4
4H-SiC MOSFET Threshold Voltage Instability Evaluated via Pulsed High-Temperature Reverse Bias and Negative Gate Bias Stresses.
Laura Anoldo, Edoardo Zanetti, Walter Coco, Alfio Russo, Patrick Fiorenza

Materials (Basel)ยท April 2024


Social Media Activity not collected for this article yet.

Sign Up to Request Social Media Analysis
© PubHawk
  • About PubHawk
  • Privacy Policy
  • Sitemap
Socials: