Publications by authors named "Ronald Dixson"

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Traceable localization enables accurate integration of quantum emitters and photonic structures with high yield.
Craig R Copeland, Adam L Pintar, Ronald G Dixson, Ashish Chanana, Kartik Srinivasan

Opt Quantum· April 2024

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Sub-picoliter Traceability of Microdroplet Gravimetry and Microscopy.
Lindsay C C Elliott, Adam L Pintar, Craig R Copeland, Thomas B Renegar, Ronald G Dixson

Anal Chem· January 2022

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Detecting nanoscale contamination in semiconductor fabrication using through-focus scanning optical microscopy.
Min-Ho Rim, Emil Agocs, Ronald Dixson, Prem Kavuri, András E Vladár

J Vac Sci Technol B Nanotechnol Microelectron· January 2020

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Wear comparison of critical dimension-atomic force microscopy tips.
Ndubuisi G Orji, Ronald G Dixson, Ernesto Lopez, Bernd Irmer

J Micro Nanolithogr MEMS MOEMS· January 2020

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Spatial dimensions in atomic force microscopy: Instruments, effects, and measurements.
Ronald Dixson, Ndubuisi Orji, Ichiko Misumi, Gaoliang Dai

Ultramicroscopy· November 2018

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Tip on Tip Imaging and Self-Consistent Calibration for Critical Dimension Atomic Force Microscopy: Refinements and Extension to Second Lateral Axis.
Ronald Dixson

J Micro Nanolithogr MEMS MOEMS· October 2018

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Multiple-Instrument Evaluation of the Consistency and Long Term Stability of Tip Width Calibration for Critical Dimension Atomic Force Microscopy.
Ronald G Dixson, Ndubuisi G Orji

J Micro Nanolithogr MEMS MOEMS· June 2017

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Comparison of line width calibration using critical dimension atomic force microscopes between PTB and NIST.
Gaoliang Dai, Kai Hahm, Harald Bosse, Ronald G Dixson

Meas Sci Technol· January 2017

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Evaluation of carbon nanotube probes in critical dimension atomic force microscopes.
Jinho Choi, Byong Chon Park, Sang Jung Ahn, Dal-Hyun Kim, Joon Lyou, Ronald G Dixson

J Micro Nanolithogr MEMS MOEMS· July 2016

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RM 8111: Development of a Prototype Linewidth Standard.
Michael W Cresswell, William F Guthrie, Ronald G Dixson, Richard A Allen, Christine E Murabito

J Res Natl Inst Stand Technol· June 2016

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Tip characterization method using multi-feature characterizer for CD-AFM.
Ndubuisi G Orji, Hiroshi Itoh, Chumei Wang, Ronald G Dixson, Peter S Walecki

Ultramicroscopy· March 2016

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Deep-subwavelength Nanometric Image Reconstruction using Fourier Domain Optical Normalization.
Jing Qin, Richard M Silver, Bryan M Barnes, Hui Zhou, Ronald G Dixson

Light Sci Appl· February 2016

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Lateral Tip Control Effects in CD-AFM Metrology: The Large Tip Limit.
Ronald G Dixson, Ndubuisi G Orji, Ryan S Goldband

J Micro Nanolithogr MEMS MOEMS· January 2016

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A moving window correlation method to reduce the distortion of scanning probe microscope images.
Wei Chu, Joseph Fu, Ronald Dixson, George Orji, Theodore Vorburger

Rev Sci Instrum· July 2009

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Computational models of a nano probe tip for static behaviors.
Shaw C Feng, Theodore V Vorburger, Che Bong Joung, Ronald G Dixson, Joseph Fu

Scanning· May 2008

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Three-dimensional image correction of tilted samples through coordinate transformation.
Joseph Fu, Wei Chu, Ronald Dixson, Theodore Vorburger

Scanning· May 2008

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Linewidth measurement technique using through-focus optical images.
Ravikiran Attota, Richard Silver, Ronald Dixson

Appl Opt· February 2008

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