Publications by authors named "M Ohlidal"

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Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films.
Ivan Ohlídal, Jiří Vohánka, Vilma Buršíková, Václav Šulc, Štěpán Šustek

Opt Express· November 2020

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Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films.
David Nečas, Ivan Ohlídal, Daniel Franta, Miloslav Ohlídal, Vladimír Čudek

Appl Opt· September 2014

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Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances.
I Ohlídal, D Franta, M Ohlídal, K Navrátil

Appl Opt· November 2001

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Characterization of the basic statistical properties of very rough surfaces of transparent solids by immersion shearing interferometry.
I Ohlídal, K Navrátil, M Ohlídal, M Druckmüller

Appl Opt· December 1994

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