Publications by authors named "Rainer Tutsch"

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True 3D Nanometrology: 3D-Probing with a Cantilever-Based Sensor.
Jan Thiesler, Thomas Ahbe, Rainer Tutsch, Gaoliang Dai

Sensors (Basel)· December 2021

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Tip wear and tip breakage in high-speed atomic force microscopes.
Timo Strahlendorff, Gaoliang Dai, Detlef Bergmann, Rainer Tutsch

Ultramicroscopy· June 2019

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Random-phase-shift Fizeau interferometer.
Hagen Broistedt, Nicolae Radu Doloca, Sebastian Strube, Rainer Tutsch

Appl Opt· December 2011

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