Publications by authors named "Detlef Bergmann"

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Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles.
Nicolas Feltin, Loïc Crouzier, Alexandra Delvallée, Francesco Pellegrino, Valter Maurino, Detlef Bergmann

Nanomaterials (Basel)· March 2023

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In situ, back-focal-plane-based determination of the numerical apertures in optical microscopes.
Jan Krüger, Detlef Bergmann, Rainer Köning, Bernd Bodermann, Eberhard Manske

Appl Opt· January 2023

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A new type of nanoscale reference grating manufactured by combined laser-focused atomic deposition and x-ray interference lithography and its use for calibrating a scanning electron microscope.
Xiao Deng, Gaoliang Dai, Jie Liu, Xiukun Hu, Detlef Bergmann

Ultramicroscopy· July 2021

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Nanomechanical Characterization of Vertical Nanopillars Using an MEMS-SPM Nano-Bending Testing Platform.
Zhi Li, Sai Gao, Uwe Brand, Karla Hiller, Susann Hahn, Detlef Bergmann

Sensors (Basel)· October 2019

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Tip wear and tip breakage in high-speed atomic force microscopes.
Timo Strahlendorff, Gaoliang Dai, Detlef Bergmann, Rainer Tutsch

Ultramicroscopy· June 2019

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Using DNA origami nanorulers as traceable distance measurement standards and nanoscopic benchmark structures.
Mario Raab, Ija Jusuk, Julia Molle, Egbert Buhr, Bernd Bodermann, Detlef Bergmann

Sci Rep· January 2018

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