Publications by authors named "Wilfried Vandervorst"

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Influence of the Emitter Shape on the Field-of-View in Atom Probe Tomography.
Masoud Dialameh, Yu-Ting Ling, Janusz Bogdanowicz, Vyacheslav S Zharinov, Olivier Richard, Wilfried Vandervorst

Microsc Microanal· February 2025

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Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlN.
Richard J H Morris, Ramya Cuduvally, Jhao-Rong Lin, Ming Zhao, Wilfried Vandervorst

Ultramicroscopy· November 2022

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Quantification of area-selective deposition on nanometer-scale patterns using Rutherford backscattering spectrometry.
Niels Claessens, Zamran Zahoor Khan, Negin Rahnemai Haghighi, Annelies Delabie, André Vantomme, Wilfried Vandervorst

Sci Rep· October 2022

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A Bottom-Up Volume Reconstruction Method for Atom Probe Tomography.
Yu-Ting Ling, Siegfried Cools, Janusz Bogdanowicz, Claudia Fleischmann, Jan De Beenhouwer, Wilfried Vandervorst

Microsc Microanal· January 2022

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Author Correction: Grain-boundary segregation of magnesium in doped cuprous oxide and impact on electrical transport properties.
João Resende, Van-Son Nguyen, Claudia Fleischmann, Lorenzo Bottiglieri, Stéphane Brochen, Wilfried Vandervorst

Sci Rep· August 2021

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Grain-boundary segregation of magnesium in doped cuprous oxide and impact on electrical transport properties.
João Resende, Van-Son Nguyen, Claudia Fleischmann, Lorenzo Bottiglieri, Stéphane Brochen, Wilfried Vandervorst

Sci Rep· April 2021

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Unravelling stacking order in epitaxial bilayer MX using 4D-STEM with unsupervised learning.
Ankit Nalin Mehta, Nicolas Gauquelin, Magnus Nord, Andrey Orekhov, Hugo Bender, Wilfried Vandervorst

Nanotechnology· October 2020

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The impact of focused ion beam induced damage on scanning spreading resistance microscopy measurements.
Komal Pandey, Kristof Paredis, Thomas Hantschel, Chris Drijbooms, Wilfried Vandervorst

Sci Rep· September 2020

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A Correlative ToF-SIMS/SPM Methodology for Probing 3D Devices.
Valentina Spampinato, Masoud Dialameh, Alexis Franquet, Claudia Fleischmann, Thierry Conard, Wilfried Vandervorst

Anal Chem· August 2020

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Enhancing the defect contrast in ECCI through angular filtering of BSEs.
Han Han, Thomas Hantschel, Andreas Schulze, Libor Strakos, Tomas Vystavel, Wilfried Vandervorst

Ultramicroscopy· March 2020

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Application of electron channeling contrast imaging to 3D semiconductor structures through proper detector configurations.
Han Han, Thomas Hantschel, Libor Strakos, Tomas Vystavel, Marina Baryshnikova, Wilfried Vandervorst

Ultramicroscopy· March 2020

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Potential sources of compositional inaccuracy in the atom probe tomography of InGaAs.
Ramya Cuduvally, Richard J H Morris, Piero Ferrari, Janusz Bogdanowicz, Claudia Fleischmann, Wilfried Vandervorst

Ultramicroscopy· March 2020

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Size-dependent optical properties of periodic arrays of semiconducting nanolines.
Andrzej Gawlik, Janusz Bogdanowicz, Andreas Schulze, Pierre Morin, Jan Misiewicz, Wilfried Vandervorst

Opt Express· March 2020

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Carrier profiling with fast Fourier transform scanning spreading resistance microscopy: A case study for Ge, GaAs, InGaAs, and InP.
Oberon Dixon-Luinenburg, Umberto Celano, Wilfried Vandervorst, Kristof Paredis

Ultramicroscopy· November 2019

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Atom probe of GaN/AlGaN heterostructures: The role of electric field, sample crystallography and laser excitation on quantification.
Richard J H Morris, Ramya Cuduvally, Davit Melkonyan, Ming Zhao, Paul van der Heide, Wilfried Vandervorst

Ultramicroscopy· November 2019

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Effects of buried grain boundaries in multilayer MoS.
Jonathan Ludwig, Ankit Nalin Mehta, Marco Mascaro, Umberto Celano, Daniele Chiappe, Wilfried Vandervorst

Nanotechnology· July 2019

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Laser-Induced Periodic Surface Structures (LIPSS) on Heavily Boron-Doped Diamond for Electrode Applications.
André F Sartori, Stefano Orlando, Alessandro Bellucci, Daniele M Trucchi, Shoshan Abrahami, Wilfried Vandervorst

ACS Appl Mater Interfaces· December 2018

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Revealing the 3-dimensional shape of atom probe tips by atomic force microscopy.
Claudia Fleischmann, Kristof Paredis, Davit Melkonyan, Wilfried Vandervorst

Ultramicroscopy· November 2018

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Layer-controlled epitaxy of 2D semiconductors: bridging nanoscale phenomena to wafer-scale uniformity.
Daniele Chiappe, Jonathan Ludwig, Alessandra Leonhardt, Salim El Kazzi, Ankit Nalin Mehta, Wilfried Vandervorst

Nanotechnology· October 2018

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Nanoscale electrochemical response of lithium-ion cathodes: a combined study using C-AFM and SIMS.
Jonathan Op de Beeck, Nouha Labyedh, Alfonso Sepúlveda, Valentina Spampinato, Alexis Franquet, Wilfried Vandervorst

Beilstein J Nanotechnol· June 2018

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Electrical characterization of single nanometer-wide Si fins in dense arrays.
Steven Folkersma, Janusz Bogdanowicz, Andreas Schulze, Paola Favia, Dirch H Petersen, Wilfried Vandervorst

Beilstein J Nanotechnol· June 2018

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Influence of the Chalcogen Element on the Filament Stability in CuIn(Te,Se,S)/AlO Filamentary Switching Devices.
Tareq Ahmad, Wouter Devulder, Karl Opsomer, Matthias Minjauw, Umberto Celano, Wilfried Vandervorst

ACS Appl Mater Interfaces· May 2018

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The flexoelectric effect in Al-doped hafnium oxide.
Umberto Celano, Mihaela Popovici, Karine Florent, Simone Lavizzari, Paola Favia, Wilfried Vandervorst

Nanoscale· May 2018

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Non-destructive characterization of extended crystalline defects in confined semiconductor device structures.
Andreas Schulze, Libor Strakos, Tomas Vystavel, Roger Loo, Antoine Pacco, Wilfried Vandervorst

Nanoscale· April 2018

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Mesoscopic physical removal of material using sliding nano-diamond contacts.
Umberto Celano, Feng-Chun Hsia, Danielle Vanhaeren, Kristof Paredis, Torbjörn E M Nordling, Wilfried Vandervorst

Sci Rep· February 2018

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